描述
CX-30E10RTL

Thermal transient test and RTL level emulation system

Brief Description

The Thermal transient test and RTL level emulation system consists of multiple modules joined by an interface frame. Each module is connected to one host workstation by either two 10m (32ft) optical fiber link cables or one 10m (32 ft.) Ethernet link cable. Up to four optional bulkhead IOs (one on each module) can interface with your custom targets. In addition, by configuring a comodel connection, you can run comodel applications to accelerate verification.

1
CX-STD ChassisCX-STD Chasis
2CX-STD System board (mother board)CX-TMC-2ND-MB V2.0
3CX-STD Power Switching Control CardCX-PSW DA30V10 V2.0
4CX-STD NTC/PTC Temperature Monitor CardCX-NPS V2.0
5CX-STD Super high speed data sampling cardCX-DTS V2.0


A fully loaded Thermal transient test and emulation system on register transfer level CX-30E10RTL system consists of
Model Number

CX-30E10RTL

Test mode

DIODE mode, SAT mode, IGBT mode, RDSON mode, HEMT mode

Corresponding device standard

Comply with JESD51-1, JESD51-14, IEC 60747-8, IEC 60747-9, IEC 60747-15, IEC 60749-23, IEC 60749-34, AEC-Q101, AQG 324 and other related standards

Gated power parameters

4x Isolated ouput; -10V ~ 20V with err. < 0.1V + 0.5%.

Gate leakage current measurement

1nA ~ 850nA; 850nA ~ 1mA;

Heating power parameters

30A/10V, err. < 0.05A + 0.1%.

Temperature measuring current source

±0.1A ~ ±1A @10V

Measuring channel

4x ±5V channels, err. < 1mV+0.5%; Dynamic range: 100mV, 200mV, 400mV, 800mV; Dynamic resolution: 16μV; Sampling rate: up to 1MHz.

Main functions and parameters
Use Modes for CX-30E10RTL
Optional functionalities is also available